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MICRON TECHNOLOGY INC

Micron Technology DRAM SDRAM, Part #MT41K512M16VRP-107 IT:P TR | Dynamic random access memory | DEX

Micron Technology DRAM SDRAM, Part #MT41K512M16VRP-107 IT:P TR | Dynamic random access memory | DEX

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The 8Gb (TwinDie) DDR3L SDRAM (1.35V) uses two Micron 4Gb DDR3L SDRAM x8 die for a 2 byte x16 device in one package.

Features

  • Uses two x8, 4Gb Micron die to make one x16 package – Single rank TwinDie – One external ZQ ball and one internal ZQ connected to VSSQ through an embedded serial resistor
  • VDD = VDDQ = 1.35V (1.283–1.45V)
  • Backward compatible to VDD = VDDQ = 1.5V ±0.075V
  • Differential bidirectional data strobe
  • 8n-bit prefetch architecture
  • Differential clock inputs (CK, CK#)
  • 8 internal banks
  • Nominal and dynamic on-die termination (ODT) for data, strobe, and mask signals
  • Programmable CAS (READ) latency (CL)
  • Programmable posted CAS additive latency (AL)
  • Programmable CAS (WRITE) latency (CWL)
  • Fixed burst length (BL) of 8 and burst chop (BC) of 4 (via the mode register set [MRS])
  • Selectable BC4 or BL8 on-the-fly (OTF)
  • Self refresh mode
  • TC of –40°C to +105°C – 64ms, 8192-cycle refresh at –40°C to +85°C – 32ms at +85°C to +105°C
  • Self refresh temperature (SRT)
  • Automatic self refresh (ASR)
  • Write leveling
  • Multipurpose register
  • Output driver calibration
  • AEC-Q100
  • PPAP submission
  • 8D response time

 


MIL:MT41K512M16VRP-107 IT:P TR

MT41K512M16VRP-107 IT:P TR

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