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MICRON TECHNOLOGY INC

Micron Technology DRAM SDRAM-DDR, Part #: MT40A512M16LY-062E AUT:E TR | Dynamic random access memory | DEX

Micron Technology DRAM SDRAM-DDR, Part #: MT40A512M16LY-062E AUT:E TR | Dynamic random access memory | DEX

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Micron Technology DRAM SDRAM-DDR, Part #: MT40A512M16LY-062E AUT:E TR | Dynamic random access memory | DEX
micron-technology-dram-sdram-ddr4-part-mt40a512m16ly-062e-aut-e-tr-dynamic-random-access-memory-dex

Micron Technology DRAM SDRAM-DDR4, Part #: MT40A512M16LY-062E AUT:E TR features: • VDD = VDDQ = 1.2V ±60mV • VPP = 2.5V –125mV/+250mV • On-die, internal, adjustable VREFDQ generation • 1.2V pseudo open-drain I/O • Refresh time of 8192-cycle at TC temperature range: – 64ms at –40°C to 85°C – 32ms at 85°C to 95°C – 16ms at 95°C to 105°C – 8ms at 105°C to 125°C • 16 internal banks (x8): 4 groups of 4 banks each • 8 internal banks (x16): 2 groups of 4 banks each • 8n-bit prefetch architecture • Programmable data strobe preambles • Data strobe preamble training • Command/Address latency (CAL) • Multipurpose register read and write capability • Write leveling • Self refresh mode • Low-power auto self refresh (LPASR) • Temperature controlled refresh (TCR) • Fine granularity refresh • Self refresh abort • Maximum power saving • Output driver calibration • Nominal, park, and dynamic on-die termination (ODT) • Data bus inversion (DBI) for data bus • Command/Address (CA) parity • Databus write cyclic redundancy check (CRC) • Per-DRAM addressability • Connectivity test • JEDEC JESD-79-4 compliant • sPPR and hPPR capability • MBIST-PPR support (Die Revision R only) • AEC-Q100 • PPAP submission

 

MIL:MT40A512M16LY-062E AUT E TR

MT40A512M16LY-062E AUT:E TR

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