Intel FPGA - Field Programmable Gate Array part # EPF6016BC256-3N

Provides an ideal low-cost, programmable alternative to highvolume gate array applications and allows fast design changes during prototyping or design testing. Product features – Register-rich, look-up table- (LUT-) based architecture – OptiFLEX® architecture that increases device area efficiency – Typical gates ranging from 5,000 to 24,000 gates – Built-in low-skew clock distribution tree – 100% functional testing of all devices; test vectors or scan chains are not required. System-level features – In-circuit reconfigurability (ICR) via external configuration device or intelligent controller – 5.0-V devices are fully compliant with peripheral component interconnect Special Interest Group (PCI SIG) PCI Local Bus Specification, Revision 2.2 – Built-in Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1-1990, available without consuming additional device logic – MultiVoltTM I/O interface operation, allowing a device to bridge between systems operating at different voltages – Low power consumption (typical specification less than 0.5 mA in standby mode) – 3.3-V devices support hot-socketing.

Intel FPGA - Field Programmable Gate Array part # EPF6016BC256-3N

ITL: EPF6016BC256-3N