MICRON TECHNOLOGY INC
Micron Technology DRAM SDRAM-DDR4, Part #MT41K512M16VRP-107 AIT:P TR | Dynamic random access memory | DEX
Micron Technology DRAM SDRAM-DDR4, Part #MT41K512M16VRP-107 AIT:P TR | Dynamic random access memory | DEX
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The 8Gb (Twin Die) DDR3L SDRAM (1.35V) uses two Micron 4Gb DDR3L SDRAM x8 die for a 2 byte x16 device in one package.
Features
- Uses two x8, 4Gb Micron die to make one x16 package – Single rank TwinDie – One external ZQ ball and one internal ZQ connected to VSSQ through an embedded serial resistor
- VDD = VDDQ = 1.35V (1.283–1.45V)
- Backward compatible to VDD = VDDQ = 1.5V ±0.075V
- Differential bidirectional data strobe
- 8n-bit prefetch architecture
- Differential clock inputs (CK, CK#)
- 8 internal banks
- Nominal and dynamic on-die termination (ODT) for data, strobe, and mask signals
- Programmable CAS (READ) latency (CL)
- Programmable posted CAS additive latency (AL)
- Programmable CAS (WRITE) latency (CWL)
- Fixed burst length (BL) of 8 and burst chop (BC) of 4 (via the mode register set [MRS])
- Selectable BC4 or BL8 on-the-fly (OTF)
- Self refresh mode
- TC of –40°C to +105°C – 64ms, 8192-cycle refresh at –40°C to +85°C – 32ms at +85°C to +105°C • Self refresh temperature (SRT)
- Automatic self refresh (ASR)
- Write leveling
- Multipurpose register
- Output driver calibration
- AEC-Q100
- PPAP submission
- 8D response time
MIL:MT41K512M16VRP-107 AIT:P TR
MT41K512M16VRP-107 AIT:P TR
